SAE J1784 Specifications and Standards for Marine Hydraulic Systems and Components (Cancelled Aug 2000)
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来源:标准资料网
Product Code:SAE J1784
Title:Specifications and Standards for Marine Hydraulic Systems and Components (Cancelled Aug 2000)
Issuing Committee:Ship Fluid Systems Committee
Scope:This document lists military and industry specifications and standards that are considered to be of particular interest to designers of marine vehicle hydraulic systems. SAE AIR737 lists additional aerospace hydraulic documents which occasionally may have application in marine hydraulic systems.
基本信息
| 标准名称： | 农药最大残留限量 霜霉威 黄瓜
|
| 发布部门： | 中华人民共和国农业部 |
| 发布日期： | 2009-04-23 |
| 实施日期： | 2009-05-20 |
| 首发日期： | |
| 作废日期： | |
| 出版社： | 中国标准出版社 |
| 出版日期： | 2009-05-20 |
适用范围
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所属分类： 食品 食品发酵 酿造 调味品 食品技术 香料和调料 食品添加剂
【英文标准名称】:Microbeamanalysis-Analyticalelectronmicroscopy-Selected-areaelectrondiffractionanalysisusingatransmissionelectronmicroscope
【原文标准名称】:微光束分析.解析电子显微测定法.透射式电子显微镜对选定区域进行电子衍射分析
【标准号】:ISO25498-2010
【标准状态】:现行
【国别】:国际
【发布日期】:2010-06
【实施或试行日期】:
【发布单位】:国际标准化组织(IX-ISO)
【起草单位】:ISO/TC202
【标准类型】:()
【标准水平】:()
【中文主题词】:分析;分析法;定义;衍射;电子束;电子衍射;电子显微镜;电子显微镜分析;分析方法;微量分析;显微术;光学仪器;换算;传输
【英文主题词】:Analysis;Analyticalmethods;Definitions;Diffraction;Electronbeams;Electrondiffraction;Electronmicroscopes;Electronmicroscopy;Methodsofanalysis;Microanalysis;Microscopy;Opticalinstruments;Scaling;Transmission
【摘要】:ThisInternationalStandardspecifiesthemethodofselected-areaelectrondiffraction(SAED)analysisusingatransmissionelectronmicroscope(TEM)toanalysemicrometerandsub-micrometersizedareasofthincrystallinespecimens.Suchspecimenscanbeobtainedintheformofthinsectionsfromavarietyofmetallicandnon-metallicmaterials,aswellasfinepowders,oralternativelybytheuseofextractionreplicas.Theminimumdiameteroftheselectedareainaspecimenwhichcanbeanalysedbythismethoddependsonthesphericalaberrationcoefficientoftheobjectivelensofthemicroscopeandapproaches0,5μmforamodernTEM.Whenthediameterofananalysedspecimenareaissmallerthan0,5μm,theanalysisprocedurecanalsobereferredtothisInternationalStandardbut,becauseoftheeffectofsphericalaberration,someofthediffractioninformationinthepatterncanbegeneratedfromoutsideoftheareadefinedbytheselected-areaaperture.Insuchcases,theuseofmicrodiffractionorconvergentbeamelectrondiffraction,whereavailable,mightbepreferred.Thesuccessoftheselected-areaelectrondiffractionmethodreliesonthevalidityofindexingthediffractionpatternsarising,irrespectiveofwhichaxisinthespecimenliesparalleltotheincidentelectronbeam.Suchanalysisisthereforeaidedbyspecimentiltandrotationfacilities.ThisInternationalStandardisapplicabletoacquisitionofSAEDpatternsfromcrystallinespecimens,indexingthepatternsandcalibrationofthediffractionconstant.
【中国标准分类号】:N33
【国际标准分类号】:71_040_50
【页数】:36P.;A4
【正文语种】:英语
